• DocumentCode
    1346129
  • Title

    Change Vector Analysis in Posterior Probability Space: A New Method for Land Cover Change Detection

  • Author

    Chen, Jin ; Chen, Xuehong ; Cui, Xihong ; Chen, Jun

  • Author_Institution
    Key Lab. of Earth Surface Processes & Resource Ecology, Beijing Normal Univ., Beijing, China
  • Volume
    8
  • Issue
    2
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    317
  • Lastpage
    321
  • Abstract
    Postclassification comparison (PCC) and change vector analysis (CVA) have been widely used for land use/cover change detection using remotely sensed data. However, PCC suffers from error cumulation stemmed from an individual image classification error, while a strict requirement of radiometric consistency in remotely sensed data is a bottleneck of CVA. This letter proposes a new method named CVA in posterior probability space (CVAPS), which analyzes the posterior probability by using CVA. The CVAPS approach was applied and validated by a case study of land cover change detection in Shunyi District, Beijing, China, based on multitemporal Landsat Thematic Mapper data. Accuracies of “change/no-change” detection and “from-to” types of change were assessed. The results show that error cumulation in PCC was reduced in CVAPS. Furthermore, the main drawbacks in CVA were also alleviated effectively by using CVAPS. Therefore, CVAPS is potentially useful in land use/cover change detection.
  • Keywords
    error analysis; geophysical image processing; image classification; probability; terrain mapping; vectors; Beijing; China; Shunyi District; change vector analysis; error cumulation; image classification error; land cover change detection; multitemporal Landsat Thematic Mapper data; postclassiflcation comparison; posterior probability space; remote sensing data; Change vector analysis (CVA); land cover change; postclassification comparison (PCC); posterior probability space;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2010.2068537
  • Filename
    5597922