DocumentCode
1346136
Title
Polarization Phase Difference Analysis for Selection of Persistent Scatterers in SAR Interferometry
Author
Samsonov, Sergey ; Tiampo, Kristy
Author_Institution
Dept. of Earth Sci., Univ. of Western Ontario, London, ON, Canada
Volume
8
Issue
2
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
331
Lastpage
335
Abstract
In this letter, we propose a technique for selecting persistent scatterers (PSs) based on their polarization phase difference (PPD). We analyze a normalized PPD between HH and VV channels averaged over a temporal set of images and select pixels that demonstrate predominantly even or odd bounce scattering properties. We compare selected scatterers to PSs selected by applying an amplitude dispersion threshold as suggested by a standard PS interferometry (PSI) approach and show that both methods are complementary. However, the proposed approach can be potentially used on a small set of synthetic aperture radar (SAR) images, which can be beneficial in the early stage of data acquisition. We apply the proposed technique to produce a deformation map for the San Francisco region from six quad-pol RADARSAT-2 SAR images acquired during 2008-2009. The coverage and the precision of the produced deformation map are higher than if it was calculated with the standard PSI technique applied to the same data set.
Keywords
geophysical image processing; geophysical techniques; radar interferometry; synthetic aperture radar; AD 2008 to 2009; HH channel; SAR Interferometry; San Francisco region; VV channel; amplitude dispersion threshold; data acquisition; deformation map; normalized PPD; odd bounce scattering properties; polarization phase difference analysis; quadpol RADARSAT-2 SAR images; standard PSI technique; standard persistent scatterer interferometry; synthetic aperture radar images; InSAR; interferometry; persistent scatterers (PSs); polarization phase difference (PPD); synthetic aperture radar (SAR);
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2010.2072904
Filename
5597923
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