Title :
Cumulative Damage Model with Correlated Interarrival Times of Shocks
Author :
Sathiyamoorthi, R.
Author_Institution :
Annamalai University, Annamalainagar; 57, Kamaleeswaran Koil Street; Chidambaram - 608 001; Tamil Nadu INDIA
Abstract :
A machine is exposed to a cumulative damage process. The damages are caused by shocks whose interarrival times are constantly correlated and exponentially distributed. Using the distribution of the exchangeable random variables, the life time distribution, its mean and variance are calculated.
Keywords :
Arithmetic; Electric shock; Inventory control; Magnetic heads; Mathematics; Random variables; Reliability theory; Statistical distributions; Statistics; Cumulative damage; Exchangeable random variables;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220811
