• DocumentCode
    1346314
  • Title

    Additional modal selectivity induced by a localized defect in quarter-wave-shifted DFB lasers

  • Author

    Fessant, Thierry ; Boucher, Yann

  • Author_Institution
    Lab. RESO, Ecole Nat. Superieure d´´Ingenieurs, Brest, France
  • Volume
    34
  • Issue
    4
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    602
  • Lastpage
    608
  • Abstract
    The effects of a localized impurity upon the threshold spectral properties of quarter-wave-shifted distributed feedback (QWS-DFB) lasers are analyzed. The singularity, which can exhibit absorbing, dephasing, as well as reflecting properties, is mathematically described by a transfer matrix so that its inclusion in the usual matrix formalism of coupled-wave equations is easy. The exact location of the singularity, its strength, as well as the grating phase with respect to the origin are found to affect greatly the modal behavior of the structure. The localized defect interacts differently with each mode due to their intracavity stationary field pattern, so that a modally selective center is produced. A correct optimization of the singularity parameters thus enables an enhancement of the laser performance
  • Keywords
    coupled mode analysis; distributed feedback lasers; impurities; laser modes; laser theory; optimisation; semiconductor device models; semiconductor lasers; absorbing; additional modal selectivity; correct optimization; coupled-wave equations; dephasing; intracavity stationary field pattern; laser performance; localized defect; localized impurity; matrix formalism; modal behavior; modally selective center; quarter-wave-shifted DFB lasers; reflecting properties; singularity; singularity parameters; threshold spectral properties; transfer matrix; Coupled mode analysis; Distributed feedback devices; Equations; Frequency; Gratings; Laser feedback; Laser modes; Optical scattering; Semiconductor impurities; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.663433
  • Filename
    663433