An analysis of a mask vibration considering contact with a damping wire

Author

You, Se Joon ; Shin, Woon Seo ; Jang, Bo Woong

Author_Institution

Digital Display R&D Center, LG Electron. Inc., Seoul, South Korea

Volume

46

Issue

2

fYear

2000

fDate

5/1/2000 12:00:00 AM

Firstpage

385

Lastpage

389

Abstract

The mask vibration degrades the color purity in a CRT. Therefore, damping wires are put into contact with the mask to reduce vibration in a perfectly flat CRT. In this study, we analyze the mask vibration contacting with the damping wires using FEM. At first we calculate the natural frequencies and mode shapes of the mask by modal analysis, and compare them with the measured results to confirm our finite element model. The modal analysis of the wire is also performed to investigate resonance with the mask. Finally, the transient dynamic analysis of the mask contacting with the wires is performed. The mask vibration is measured to confirm our analysis results, and the measured results are in good agreement with those of the analysis

Keywords

cathode-ray tubes; damping; finite element analysis; modal analysis; vibrations; FEM; color purity; damping wire; finite element model; mask vibration; modal analysis; mode shapes; natural frequencies; perfectly flat CRT; transient dynamic analysis; Cathode ray tubes; Damping; Degradation; Finite element methods; Frequency measurement; Modal analysis; Shape measurement; Transient analysis; Vibration measurement; Wires;

fLanguage

English

Journal_Title

Consumer Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0098-3063

Type

jour

DOI

10.1109/30.846674

Filename

846674