Title :
Eigenvalue Analysis and Longtime Stability of Resonant Structures for the Meshless Radial Point Interpolation Method in Time Domain
Author :
Kaufmann, Thomas ; Engström, Christian ; Fumeaux, Christophe ; Vahldieck, Rüdiger
Author_Institution :
Lab. for Electromagn. Fields & Microwave Electron. (IFH), ETH Zurich, Zürich, Switzerland
Abstract :
A meshless collocation method based on radial basis function (RBF) interpolation is presented for the numerical solution of Maxwell´s equations. RBFs have attractive properties such as theoretical exponential convergence for increasingly dense node distributions. Although the primary interest resides in the time domain, an eigenvalue solver is used in this paper to investigate convergence properties of the RBF interpolation method. The eigenvalue distribution is calculated and its implications for longtime stability in time-domain simulations are established. It is found that eigenvalues with small, but nonzero, real parts are related to the instabilities observed in time-domain simulations after a large number of time steps. Investigations show that by using global basis functions, this problem can be avoided. More generally, the connection between the high matrix condition number, accuracy, and the magnitude of nonzero real parts is established.
Keywords :
Maxwell equations; eigenvalues and eigenfunctions; electromagnetic field theory; interpolation; mesh generation; time-domain analysis; Maxwell equations; RBF interpolation method; dense node distributions; eigenvalue analysis; global basis functions; meshless collocation method; meshless radial point interpolation method; radial basis function interpolation; resonant structure longtime stability; theoretical exponential convergence; time-domain simulations; Accuracy; Convergence; Eigenvalues and eigenfunctions; Interpolation; Numerical stability; Shape; Time domain analysis; Eigenfunctions and eigenvalues; finite-difference methods; meshless methods; resonance; time-domain modeling;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2010.2081250