Title :
Formal-Analysis-Based Trace Computation for Post-Silicon Debug
Author :
Gort, Marcel ; De Paula, Flavio M. ; Kuan, Johnny J W ; Aamodt, Tor M. ; Hu, Alan J. ; Wilton, Steven J E ; Yang, Jin
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Abstract :
This paper presents a post-silicon debug methodology that provides a means to rewind, or backspace, a chip from a known crash state using a combination of on-chip real-time data collection and off-chip formal analysis methods. A complete debug flow is presented that considers practical considerations such as area, on-chip non-determinism and signal propagation delay. This flow, along with a low-overhead breakpoint circuit, allows for state-accurate breakpointing capabilities without the need to monitor the entire state of the chip. The flow and associated hardware was tested using a hardware prototype, which consists of an OpenRISC processor instrumented with the debug hardware connected to a PC running the formal verification algorithms. Traces hundreds of cycles long were obtained using the methodology presented in this paper.
Keywords :
circuit CAD; electronic engineering computing; formal verification; OpenRISC processor; breakpointing capabilities; complete debug flow; debug hardware; formal verification; low-overhead breakpoint circuit; off-chip formal analysis; on-chip nondeterminism; on-chip real-time data collection; post-silicon debug; signal propagation delay; trace computation; Computer bugs; Debugging; Hardware; Monitoring; System-on-a-chip; Formal analysis; hardware breakpoint; post-silicon debug; silicon debug; validation;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2011.2166416