DocumentCode :
1346478
Title :
Scientific Interchange
Author :
Weir, W.Thomas
Author_Institution :
Evaluation Associates, Inc.; GSB Bldg., 1 Belmont Avenue; Bala Cynwyd, PA 19004 USA.
Issue :
4
fYear :
1980
Firstpage :
346
Lastpage :
349
Abstract :
This paper reports on the 1979 IEEE delegation´s visit to the People´s Republic of China, 1979 September 15 to October 7. Particular attention is given to the China Electronic Product Reliability and Environmental Testing Research Institute; the Institute is the only one of its kind in the People´s Republic of China and has the responsibility to develop reliability work on electronic products and to act as a `forcing function´ to improve the reliability of China´s electronic products.
Keywords :
Electronic equipment testing; Ferrimagnetic materials; Magnetic materials; Maintenance; Microwave devices; Photovoltaic cells; Reliability engineering; Semiconductor device reliability; Software engineering; X-ray lasers; Delegation; People´s Republic of China; Visit;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1980.5220869
Filename :
5220869
Link To Document :
بازگشت