Title :
Bayesian 1-Sample Prediction for the 2-Parameter Weibull Distribution
Author :
Evans, I.G. ; Nigm, A.H.M.
Author_Institution :
Dept. of Statistics; University College of Wales; Aberystwyth; Wales; U.K.
Abstract :
Given the first few failures times of a sample of components whose lifetimes follow a Weibull distribution with both scale and shape parameters unknown, a Bayesian approach is used to derive prediction bounds for the failure times of the remaining components in the sample. Iterative procedures involving considerable computation are necessary for calculating prediction bounds, but some simplification is possible on restricting the shape parameter to a finite number of values. A numerical example illustrates the procedures.
Keywords :
Bayesian methods; Educational institutions; Failure analysis; Information analysis; Life testing; Random variables; Shape; Statistical analysis; Statistical distributions; Weibull distribution; Bayesian prediction; Censored data; Weibull life distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1980.5220902