• DocumentCode
    1347162
  • Title

    An integrated system for prediction and analysis of solder interconnection shapes

  • Author

    Zhao, Xiujuan ; Wang, Chunqing ; Wang, Guozhong ; Zheng, Guanqun ; Yang, Shiqin

  • Author_Institution
    Harbin Inst. of Technol., China
  • Volume
    23
  • Issue
    2
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    87
  • Lastpage
    92
  • Abstract
    In this paper, an integrated system [predicting solder interconnection shapes (PSIS)] is built to predict and analyze the shape of solder interconnections in electronic packaging. The purposes are to numerically simulate the formation of solder joints, analyze the shape of solder joints and its influential factors and provide an efficient tool for design and manufacturing engineers to improve the integrity of solder interconnections. The formation of solder joints is numerically simulated through a surface evolver program and the calculation is automated with an additional controller. A datafile generator is developed in which the potential energies, geometry of the conjunction and boundary conditions of the initial solder joint can be generated visually and transferred into evolver syntax automatically. A post processor is built to analyze the global three-dimensional (3-D) shape and cross section profiles of solder fillets. Also, the applications for solder interconnection shape prediction of chip component (RC3216) are conducted with this system
  • Keywords
    circuit reliability; failure analysis; packaging; soldering; 3D shape; PSIS; boundary conditions; chip component; cross section profiles; datafile generator; electronic packaging; integrity; potential energies; solder interconnection shapes; solder joints; surface evolver program; Analytical models; Automatic control; Design engineering; Electronics packaging; Geometry; Numerical simulation; Potential energy; Shape; Soldering; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.846931
  • Filename
    846931