• DocumentCode
    1347266
  • Title

    Analysis of Performance-Degradation Data from Accelerated Tests

  • Author

    Nelson, Wayne

  • Author_Institution
    Bldg. 37, Room 578; G.E. Research & Development; Schenectady, NY 12345 USA.
  • Issue
    2
  • fYear
    1981
  • fDate
    6/1/1981 12:00:00 AM
  • Firstpage
    149
  • Lastpage
    155
  • Abstract
    The performance of many products degrades as the product ages. Such degradation is usually slow but can be accelerated by a high `stress´. For example, the breakdown strength of electrical insulation depends on age and temperature. In some tests, the performance of a test unit is measured only once at a chosen age. For example, an insulation specimen yields only one breakdown measurement. A model and analyses for such data are described in this tutorial article. Also described is a method for estimating the distribution of time to failure, defined to be the age when performance degrades below a specified level.
  • Keywords
    Acceleration; Data analysis; Degradation; Dielectrics and electrical insulation; Electric breakdown; Life estimation; Performance analysis; Performance evaluation; Stress; Testing; Accelerated tests; Arrhenius law; Data analysis; Product degradation;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1981.5221010
  • Filename
    5221010