• DocumentCode
    1347417
  • Title

    Controlled manipulation of molecular samples with the nanoManipulator

  • Author

    Guthold, Martin ; Falvo, Michael R. ; Matthews, W. Garrett ; Paulson, Scott ; Washburn, Sean ; Erie, Dorothy A. ; Superfine, Richard ; Brooks, Frederick P., Jr. ; Taylor, Russell M., II

  • Author_Institution
    Dept. of Comput. Sci., North Carolina Univ., Chapel Hill, NC, USA
  • Volume
    5
  • Issue
    2
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    189
  • Lastpage
    198
  • Abstract
    The nanoManipulator system adds a virtual-reality interface to an atomic-force microscope (AFM), thus providing a tool that can be used by scientists to image and manipulate nanometer-sized molecular structures in a controlled manner. As the AFM tip scans the sample, the tip-sample interaction forces are monitored, which, in turn, can yield information about the frictional, mechanical, material, and topological properties of the sample. Computer graphics are used to reconstruct the surface for the user, with color or contours overlaid to indicate additional data sets. Moreover, a force feedback stylus, which is connected to the tip via software, allows the user to directly interact with the macromolecules. This system is being used to investigate carbon nanotubes, DNA, fibrin, adeno- and tobacco mosaic virus. It is now also possible to insert this system into a scanning electron microscope which provides the user with continuous images of the sample, even while the AFM tip is being used for manipulations
  • Keywords
    atomic force microscopy; carbon nanotubes; computer graphics; force feedback; macromolecules; micromanipulators; nanotechnology; DNA; adenovirus; atomic-force microscope; carbon nanotubes; computer graphics; fibrin; force feedback stylus; macromolecules; molecular structures; nanoManipulator; tip-sample interaction forces; tobacco mosaic virus; Atomic force microscopy; Carbon nanotubes; Computer graphics; Computerized monitoring; Control systems; Force feedback; Image reconstruction; Mechanical factors; Nanostructures; Surface reconstruction;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/3516.847092
  • Filename
    847092