Title :
Two Repairable Multistate Devices with General Repair-Time Distributions
Author :
Yamashiro, Mitsuo
Author_Institution :
Department of Planning Technology; Ashikaga Institute of Technology; 268-1, Oomae-cho; Ashikaga-shi, Tochigi-ken, JAPAN.
fDate :
6/1/1981 12:00:00 AM
Abstract :
The system has two parallel redundant multistate devices with general repair-time distributions. The Laplace transforms of state probability and the mean time to system failure (MTSF) are obtained and a particular case is considered.
Keywords :
Hazards; Production engineering; Reliability theory; Technology planning; Multistate devices; Supplementary variable method;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1981.5221038
