Title :
Economy-class ion-defying ICs in orbit
Author :
Benedetto, Ioseph M.
Author_Institution :
UTMC Microelectron. Syst., Colorado Springs, CO, USA
fDate :
3/1/1998 12:00:00 AM
Abstract :
Space can be hostile in the extreme to the electronics in the hundreds of satellites now being readied for launch into low orbit. This paper describes how, now more than ever, satellite designers need an economical method of protecting their circuits from permanent damage and transient failure caused by the radiation belts that surround the Earth.
Keywords :
artificial satellites; integrated circuits; radiation belts; radiation hardening (electronics); space vehicle electronics; circuit protection; low Earth orbit; permanent damage; radiation belts; satellite electronics; transient failure; Artificial satellites; Belts; Consumer electronics; Costs; Degradation; Earth; Electron traps; Ionizing radiation; Protons; Radiation hardening;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1998.663756
