• DocumentCode
    1347482
  • Title

    Simple Electromagnetic Modeling Procedure: From Near-Field Measurements to Commercial Electromagnetic Simulation Tool

  • Author

    López, Priscila Fernández ; Arcambal, Christian ; Baudry, David ; Verdeyme, Serge ; Mazari, Bélahcène

  • Author_Institution
    Embedded Electron. Syst. Res. Inst. (IRSEEM), St. Etienne du Rouvray, France
  • Volume
    59
  • Issue
    12
  • fYear
    2010
  • Firstpage
    3111
  • Lastpage
    3121
  • Abstract
    As the first part of a study that aims to propose tools to take into account some electromagnetic compatibility aspects, we have developed a model to predict the electric and magnetic fields emitted by a device. This model is based on a set of equivalent sources (electric and magnetic dipoles) obtained from the cartographies of the tangential components of electric and magnetic near fields. One of its features is to be suitable for a commercial electromagnetic simulation tool based on a finite element method. This paper presents the process of modeling and the measurement and calibration procedure to obtain electromagnetic fields necessary for the model; the validation and the integration of the model into a commercial electromagnetic simulator are then performed on a Wilkinson power divider.
  • Keywords
    calibration; electric field measurement; electromagnetic compatibility; finite element analysis; magnetic field measurement; network analysis; power dividers; Wilkinson power divider; calibration procedure; commercial electromagnetic simulation tool; electric near field measurement; electromagnetic compatibility; electromagnetic modeling procedure; equivalent sources; finite element method; magnetic near field measurement; Antenna measurements; Electromagnetic compatibility; Electromagnetic measurements; Integrated circuit modeling; Probes; Simulation; Circuit modeling; dipole arrays; electromagnetic compatibility (EMC); electromagnetic measurements; simulation software;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2063070
  • Filename
    5599298