• DocumentCode
    1347509
  • Title

    Boolean Functions Over Nano-Fabrics: Improving Resilience Through Coding

  • Author

    Lee, Sang Hyun ; Vishwanath, Sriram

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX, USA
  • Volume
    20
  • Issue
    11
  • fYear
    2012
  • Firstpage
    2054
  • Lastpage
    2065
  • Abstract
    This paper determines mechanisms to mitigate errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap, but unreliable nano-device as the main function and reliable, but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don´t-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm. (Here, the word “dynamic programming” is used in the same sense as computer-science literature, i.e., and as an efficient search algorithm over trees).
  • Keywords
    Boolean functions; CMOS integrated circuits; coding errors; dynamic programming; nanoelectronics; trees (mathematics); Boolean functions; CMOS devices; atomic variations; coding; constraint satisfaction problem; defect rates; error mitigation; nanocircuits; nanodevice; nanofabrics; resilience; tree-based dynamic programming; Boolean functions; Digital arithmetic; Error correction; Integrated circuit reliability; Nanofabrication; Polynomials; Cyclic codes; don´t-care (DC) substitution; error correction; nano-fabrics;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2166417
  • Filename
    6042351