DocumentCode :
1347749
Title :
Stochastic Reliability-Growth: A Model for Fault-Removal in Computer-Programs and Hardware-Designs
Author :
Littlewood, Bev
Author_Institution :
Mathematics Department; The City University; Northampton Square; London ECIV OHB ENGLAND.
Issue :
4
fYear :
1981
Firstpage :
313
Lastpage :
320
Abstract :
An assumption commonly made in early models of software reliability is that the failure rate of a program is a constant multiple of the (unknown) number of faults remaining. This implies that all faults contribute the same amount to the failure rate of the program. The assumption is challenged and an alternative proposed. The suggested model results in earlier fault-fixes having a greater effect than later ones (the faults which make the greatest contribution to the overall failure rate tend to show themselves earlier, and so are fixed earlier), and the DFR property between fault fixes (assurance about programs increases during periods of failure-free operation, as well as at fault fixes). The model is tractable and allows a variety of reliability measures to be calculated. Predictions of total execution time to achieve a target reliability, and total number of fault fixes to target reliability, are obtained. The model might also apply to hardware reliability growth resulting from the elimination of design errors.
Keywords :
Battery powered vehicles; Computer errors; Hardware; Predictive models; Reliability engineering; Reliability theory; Software debugging; Software reliability; Stochastic processes; Time measurement; Decreasing failure rate; Design debugging; Design errors; Pareto distribution; Probability distribution mixture; Program debugging model; Reliability growth; Software errors; Software failure rate; Software faults; Software reliability;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1981.5221099
Filename :
5221099
Link To Document :
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