Title :
Prediction Limits for the Last Failure Time of a (Log) Normal Sample from Early Failures
Author :
Nelson, Wayne ; Schmee, Josef
Author_Institution :
General Electric Co., Schenectady; Bldg. 37, Room 578; G.E. Research & Development; Schenectady, NY 12345 USA.
Abstract :
Sometimes one wants to predict how long a sample of units will run until all fail. This paper presents prediction limits for the last failure time of a sample from a s-normal or lognormal life distribution when one has observed the earliest r failures.
Keywords :
Data analysis; Data engineering; Educational institutions; Exponential distribution; Pareto analysis; Prediction methods; Senior members; Statistical distributions; Statistics; Testing; Censored life data; Lognormal life distributions; Prediction limits; Product life; s-Normal life distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1981.5221171
