• DocumentCode
    1348474
  • Title

    Instrumentation V: ICs: From sensors to displays: Instrument performance is up, costs are down. It´s done, not with mirrors, but with integrated circuits

  • Author

    Allan, R.

  • Volume
    13
  • Issue
    4
  • fYear
    1976
  • fDate
    4/1/1976 12:00:00 AM
  • Firstpage
    58
  • Lastpage
    62
  • Abstract
    From small simple digital panel meters to large sophisticated test systems, integrated circuits continue to have a vast impact on improvements in instrument performance. The driving force behind all this has been the continuous increase in IC-device volumetric efficiency-from SSI to MSI to today´s LSI ICs.
  • Keywords
    display equipment; electric sensing devices; instrumentation; large scale integration; monolithic integrated circuits; LSI; digital panel meters; displays; microprocessor; monolithic IC; sensors; test systems; thick film technology; thin film technology; Instruments; Integrated circuit modeling; Large scale integration; Microprocessors; Sensors; Transducers;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1976.6367453
  • Filename
    6367453
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1348474