DocumentCode :
1348511
Title :
Probability-based bus headway regularity measure
Author :
Lin, James ; Ruan, M.
Author_Institution :
Dept. of Civil & Mater. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Volume :
3
Issue :
4
fYear :
2009
fDate :
12/1/2009 12:00:00 AM
Firstpage :
400
Lastpage :
408
Abstract :
In frequently serviced bus routes passengers are more concerned about bus headway regularity than actual punctuality of bus arrival to the schedule. Buses arriving within very small (bus bunching) or very large headways are of particular concern and much less desirable. In this study, a time-point (stop) level probability-based headway regularity metric to measure bus service reliability is first formulated as a function of bus dwell time, number of stops into the trip, passenger activities (i.e. arrival, boarding and alighting) and expectation (or tolerance) of bus headways. The proposed metric is then applied to evaluate a Chicago Transit Authority bus route by using automatic vehicle location (AVL) data. It is found that headway regularity during a bus trip is closely impacted by dispatching headway. Furthermore, the time-point level service reliability declines as passenger activity levels increase or as the maximum passenger anticipated headway decreases (i.e. passengers become more demanding of frequent bus services). The case study demonstrates that the proposed probability-based headway regularity measure provides an operationable metric to transit agencies in terms of improving the transit service to meet passengers´ expectation and thus increase ridership. Lastly, this study demonstrates another important application of the AVL/APC data.
Keywords :
probability; reliability; road vehicles; Chicago Transit Authority bus route; automatic passenger counter data; automatic vehicle location data; bus dwell time; dispatching headway; operationable metric; probability-based bus headway regularity measure; time-point level service reliability;
fLanguage :
English
Journal_Title :
Intelligent Transport Systems, IET
Publisher :
iet
ISSN :
1751-956X
Type :
jour
DOI :
10.1049/iet-its.2008.0088
Filename :
5345674
Link To Document :
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