DocumentCode :
1348599
Title :
Room-Temperature Operation of Silicon Single-Electron Transistor Fabricated Using Optical Lithography
Author :
Sun, Yongshun ; Rusli ; Singh, Navab
Author_Institution :
Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
Volume :
10
Issue :
1
fYear :
2011
Firstpage :
96
Lastpage :
98
Abstract :
We report on room-temperature operation of Si nanowires (SiNWs) based single-electron transistors (SETs) fabricated based on the top-down approach using conventional optical lithography. The SETs exhibit strong Coulomb oscillation at room temperature due to extreme small size of SiNW, which has a diameter of 4 nm. The optical lithography approach is attractive compared to the commonly used electron beam lithography for the fabrication of SETs because it offers the possibility of integrating Si single-electron electronics with CMOS technology.
Keywords :
elemental semiconductors; nanofabrication; nanowires; photolithography; semiconductor quantum wires; silicon; single electron transistors; CMOS technology; Coulomb oscillation; Si; nanowires; optical lithography; silicon single-electron transistor; single-electron electronics; single-electron transistors; temperature 293 K to 298 K; top-down approach; Coulomb oscillation; optical lithography; silicon nanowires (SiNWs); single-electron transistor (SET);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2010.2086475
Filename :
5599873
Link To Document :
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