• DocumentCode
    1348599
  • Title

    Room-Temperature Operation of Silicon Single-Electron Transistor Fabricated Using Optical Lithography

  • Author

    Sun, Yongshun ; Rusli ; Singh, Navab

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • Volume
    10
  • Issue
    1
  • fYear
    2011
  • Firstpage
    96
  • Lastpage
    98
  • Abstract
    We report on room-temperature operation of Si nanowires (SiNWs) based single-electron transistors (SETs) fabricated based on the top-down approach using conventional optical lithography. The SETs exhibit strong Coulomb oscillation at room temperature due to extreme small size of SiNW, which has a diameter of 4 nm. The optical lithography approach is attractive compared to the commonly used electron beam lithography for the fabrication of SETs because it offers the possibility of integrating Si single-electron electronics with CMOS technology.
  • Keywords
    elemental semiconductors; nanofabrication; nanowires; photolithography; semiconductor quantum wires; silicon; single electron transistors; CMOS technology; Coulomb oscillation; Si; nanowires; optical lithography; silicon single-electron transistor; single-electron electronics; single-electron transistors; temperature 293 K to 298 K; top-down approach; Coulomb oscillation; optical lithography; silicon nanowires (SiNWs); single-electron transistor (SET);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2010.2086475
  • Filename
    5599873