Title :
Reliability Growth and Duane Learning Curves
Author :
Jaaskelainen, Pentti
Author_Institution :
Nokia Electronics; POBox 780; 00101 Helsinki 10, FINLAND.
fDate :
6/1/1982 12:00:00 AM
Abstract :
This paper examines Duane learning curves for reliability improvement between successive reliability tests. A constant failure rate ratio between successive tests gives curved lines on a Duane plot. Gordon´s observation that dominant failures appear exponentially with test time leads to exponential failure rate ratio models. These models, although not the only possible ones, give results that agree well with observations from practice.
Keywords :
Electronic equipment testing; Engineering management; Equipment failure; Guidelines; Production; Reliability engineering; Reliability theory; System testing; Duane learning curve; Reliability growth; Reliability testing;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1982.5221280