DocumentCode :
1348754
Title :
Reliability Growth and Duane Learning Curves
Author :
Jaaskelainen, Pentti
Author_Institution :
Nokia Electronics; POBox 780; 00101 Helsinki 10, FINLAND.
Issue :
2
fYear :
1982
fDate :
6/1/1982 12:00:00 AM
Firstpage :
151
Lastpage :
154
Abstract :
This paper examines Duane learning curves for reliability improvement between successive reliability tests. A constant failure rate ratio between successive tests gives curved lines on a Duane plot. Gordon´s observation that dominant failures appear exponentially with test time leads to exponential failure rate ratio models. These models, although not the only possible ones, give results that agree well with observations from practice.
Keywords :
Electronic equipment testing; Engineering management; Equipment failure; Guidelines; Production; Reliability engineering; Reliability theory; System testing; Duane learning curve; Reliability growth; Reliability testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1982.5221280
Filename :
5221280
Link To Document :
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