• DocumentCode
    1348799
  • Title

    Batteries: Unwanted memory spooks nickel-cadmium cells: New understanding of an undesirable phenomenon is the first step in avoiding it

  • Author

    Pensabene, S.F. ; Gould, J.W.

  • Author_Institution
    General Electric Co., Gainesville, FL, USA
  • Volume
    13
  • Issue
    9
  • fYear
    1976
  • Firstpage
    33
  • Lastpage
    37
  • Abstract
    The effect of undesirable phenomenon is defined as `an apparent reduction in capacity to a predetermined discharge voltage cut-off point (usually one volt) resulting from repetitive use patterns´. The suspected cause, and the reasons for its rarity, are explained after a brief discussion identifying the main components within a sintered-plate cell.
  • Keywords
    primary cells; Ni-Cd cell; capacity reduction; discharge voltage; electrolyte penetration; memory effect; repetitive use patterns; sintered plate type; Batteries; Cadmium; Chemicals; Discharges (electric); Materials; Particle separators; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1976.6367515
  • Filename
    6367515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1348799