Title :
What went wrong I: The failure tracers: A review off how reliability experts and analysts probe for the primary cause off device and systems faults
Abstract :
A review is given of how reliability experts and analysts probe for the primary cause of device and systems faults.
Keywords :
fault location; reliability; analysts; device faults; failure tracers; reliability experts; systems faults; Failure analysis; Integrated circuits; Metallization; Random access memory; Reliability; Wires;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1976.6367546
