• DocumentCode
    1349016
  • Title

    Photovoltaic Array Reliability Optimization

  • Author

    Ross, Ronald G., Jr.

  • Author_Institution
    Mail Stop 510-200, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109 USA.
  • Issue
    3
  • fYear
    1982
  • Firstpage
    246
  • Lastpage
    251
  • Abstract
    Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these studies and draws general conclusions relative to optimal reliability features for modules. The analysis is based on designing for specified low levels of component failures and then controlling the degrading effects of the failures through the use of fault tolerant circuitry and module replacement. Means of selecting the cost-optimal level of component failures, circuit redundancy, and module replacement are described.
  • Keywords
    Degradation; Dielectrics and electrical insulation; Electric breakdown; Failure analysis; Fatigue; Glass; Integrated circuit interconnections; Integrated circuit reliability; Photovoltaic systems; Solar power generation; Circuit design; Fault tolerance; Photovoltaics; Solar cell;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1982.5221328
  • Filename
    5221328