DocumentCode
1349016
Title
Photovoltaic Array Reliability Optimization
Author
Ross, Ronald G., Jr.
Author_Institution
Mail Stop 510-200, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109 USA.
Issue
3
fYear
1982
Firstpage
246
Lastpage
251
Abstract
Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these studies and draws general conclusions relative to optimal reliability features for modules. The analysis is based on designing for specified low levels of component failures and then controlling the degrading effects of the failures through the use of fault tolerant circuitry and module replacement. Means of selecting the cost-optimal level of component failures, circuit redundancy, and module replacement are described.
Keywords
Degradation; Dielectrics and electrical insulation; Electric breakdown; Failure analysis; Fatigue; Glass; Integrated circuit interconnections; Integrated circuit reliability; Photovoltaic systems; Solar power generation; Circuit design; Fault tolerance; Photovoltaics; Solar cell;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1982.5221328
Filename
5221328
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