Title :
Electrostatic potential due to a potential drop across a slit
Author :
Noh, Young C. ; Eom, Hyo J.
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fDate :
4/1/1998 12:00:00 AM
Abstract :
The electrostatic potential and charge density due to a potential drop across a slit in a thick conducting plane are obtained in analytic closed form. The Fourier transform, mode matching, and superposition are used to represent the potential in the spectral domain. The residue calculus is applied to represent the potential distribution in converging series form. Numerical computations are performed to illustrate the charge-density distribution through a slit
Keywords :
Fourier transforms; electric potential; electrostatics; mode matching; spectral-domain analysis; Fourier transform; charge density; conducting plane; converging series; electrostatic potential; mode matching; numerical computation; potential drop; residue calculus; slit; spectral domain; superposition; Aperture antennas; Boundary conditions; Calculus; Distributed computing; Electrostatic analysis; Fourier transforms; Geometry; Quantum computing; Spectral analysis;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
