Title :
Tougher jobs, tougher instruments: More complex measurement problems are being solved by microprocessors, bussed systems, and software
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fDate :
4/1/1977 12:00:00 AM
Abstract :
More complex electronic test and measurement instruments which are being solved by microprocessors, bussed systems, and software.
Keywords :
computerised instrumentation; test equipment; bussed systems; electronic measurement instrument; electronic test instrument; microprocessors; software; Accuracy; Reliability; Semiconductor device measurement; Software; Standards; Voltmeters;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1977.6367577
