Title :
ATE: Not so easy: As components and subsystems become more complex, automatic testing grows difficult and costly
fDate :
4/1/1977 12:00:00 AM
Abstract :
Discusses briefly the technological development in automatic electronic circuit board testing. The subjects mentioned include LSI PCB testing, software generated tests, diagnostic software, and fault detector.
Keywords :
automatic test equipment; electronic equipment testing; printed circuits; ATE; PCB testing; diagnostic software; fault detector; software generated tests; Circuit faults; Computers; Generators; Large scale integration; Production; Software; Testing;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1977.6367578
