• DocumentCode
    1349147
  • Title

    ATE: Not so easy: As components and subsystems become more complex, automatic testing grows difficult and costly

  • Author

    Torrero, E.A.

  • Volume
    14
  • Issue
    4
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    29
  • Lastpage
    36
  • Abstract
    Discusses briefly the technological development in automatic electronic circuit board testing. The subjects mentioned include LSI PCB testing, software generated tests, diagnostic software, and fault detector.
  • Keywords
    automatic test equipment; electronic equipment testing; printed circuits; ATE; PCB testing; diagnostic software; fault detector; software generated tests; Circuit faults; Computers; Generators; Large scale integration; Production; Software; Testing;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1977.6367578
  • Filename
    6367578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1349147