Title :
Measurement of the subpixel structure of AXAF CCD´s
Author :
Pivovaroff, M. ; Jones, S. ; Bautz, M. ; Kissel, S. ; Prigozhin, G. ; Ricker, G. ; Tsunemi, H. ; Miyata, E.
Author_Institution :
Dept. of Phys., MIT, Cambridge, MA, USA
fDate :
4/1/1998 12:00:00 AM
Abstract :
The authors present a method to measure the subpixel structure of a charge-coupled device (CCD), information necessary to accurately determine (<1% uncertainty) the absolute detection efficiency of the device. Their approach uses a thin metal film with periodically spaced holes (small, compared to the pixel size) to localize incident X-rays to a particular region of the pixel. The mesh is rotated to create a small angular misalignment between the grid holes and the CCD pixels, producing a moire effect in the data. The resultant moire pattern is compared to a CCD model, and a best fit minimization technique is used to constrain the parameters that describe the subpixel structure. This technique was developed to measure and calibrate the X-ray CCD´s that will comprise one of the two focal plane instruments on-board AXAF, but it is applicable for measuring the structure of any pixelated solid state device
Keywords :
CCD image sensors; X-ray apparatus; X-ray astronomy; X-ray detection; X-ray optics; astronomical instruments; astronomical telescopes; calibration; silicon radiation detectors; AXAF CCD; Advanced X-ray Astrophysics Facility; Si; X-ray imaging; X-ray telescope; absolute detection efficiency; astronomical telescope; best fit minimization technique; charge-coupled device; focal plane instruments; incident X-rays; moire pattern; periodically spaced holes; pixelated solid state device; satellite instrument; solid state device; subpixel structure; Astronomy; Charge coupled devices; Extraterrestrial measurements; Instruments; Optical devices; Optical films; Space technology; Spatial resolution; Telescopes; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
