DocumentCode :
1349362
Title :
Point Estimation of the Parameter of a Truncated Exponential Distribution
Author :
Suich, Ronald ; Rutemiller, Herbert C.
Author_Institution :
Department of Management Science; California State University; Fullerton, CA 92634 USA.
Issue :
4
fYear :
1982
Firstpage :
393
Lastpage :
397
Abstract :
This paper addresses point estimation of the failure rate parameter for a 1-parameter exponential distribution, based on random samples taken from a severely right-truncated distribution (truncation point known). The maximum likelihood estimation (MLE) leads to frequent estimates of zero failure rate, even for large samples. We suggest two alternative estimators which overcome this problem, a Bayes estimator and a composite estimator. These estimators are compared, through Monte Carlo trials, with the MLE, both in terms of s-bias and root mean square (rms) error. Based on these comparisons, the composite estimator is recommended. A numerical example illustrates the use of these estimators.
Keywords :
Art; Equations; Exponential distribution; Iterative methods; Manufacturing; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Root mean square; Sampling methods; Exponential distribution; Truncated exponential distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1982.5221389
Filename :
5221389
Link To Document :
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