DocumentCode :
1349392
Title :
High-Power and High-Efficiency InGaN-Based Light Emitters
Author :
Laubsch, Ansgar ; Sabathil, Matthias ; Baur, Johannes ; Peter, Matthias ; Hahn, Berthold
Author_Institution :
OSRAM Opto Semicond. GmbH, Regensburg, Germany
Volume :
57
Issue :
1
fYear :
2010
Firstpage :
79
Lastpage :
87
Abstract :
In this paper, we report on the latest advancements in improving AlGaInN-based visible-light-emitting-diode (LED) efficiency in epitaxy, chip, and package designs. We investigate the fundamental origin of the typical high current ¿droop¿ of efficiency observed in such LEDs. We show that this effect is most likely not caused by incomplete carrier injection or carrier escape but that it is rather a fundamental material property of InGaN/GaN-heterostructure-based light emitters. The droop can be reduced in improved epitaxial LED active-layer designs. We show how this can be achieved by lowering InGaN volume carrier density in multiple quantum wells (MQWs) and thick InGaN layers. Improved epitaxial MQW structures are then combined with a new advanced chip concept. It is optimized for high efficiency at high current operation and arbitrary scalability and can be manufactured at low cost. This is accomplished by improving light-extraction efficiency, homogenizing the emission pattern, reducing forward voltage, and lowering thermal resistance. The improved high current efficiency can be fully exploited by mounting the chip in the highly versatile new OSLON SSL package. It features very stable package materials, a small footprint, and an electrically isolated design decoupling electrical and thermal contacts.
Keywords :
III-V semiconductors; electrical contacts; gallium compounds; indium compounds; light emitting diodes; packaging; semiconductor quantum wells; thermal resistance; InGaN-GaN; electrical contacts; epitaxial LED active layer; heterostructure based light emitters; multiple quantum wells; package designs; thermal contacts; thermal resistance; visible light emitting diode; volume carrier density; Charge carrier density; Cost function; Epitaxial growth; Light emitting diodes; Manufacturing; Material properties; Packaging; Quantum well devices; Scalability; Thermal resistance; Droop; GaN; InGaN; LED degradation; LED package technology; LED-chip technology; internal quantum efficiency (IQE); light-emitting diode (LED); nitride;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2009.2035538
Filename :
5345808
Link To Document :
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