• DocumentCode
    1349470
  • Title

    Instrumentation: More bang for the buck: Test gear exploits complex integrated circuits to do more, faster

  • Author

    Allan, R.

  • Volume
    14
  • Issue
    1
  • fYear
    1977
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    The use of large scale integrated circuits for measuring instruments especially the capacitance measurement is shown.
  • Keywords
    capacitance measurement; large scale integration; capacitance measurement; large scale integrated circuits; measuring instruments; Electrical resistance measurement; Instruments; Microprocessors; Radiation detectors; Safety; Semiconductor device measurement; Standards;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1977.6367638
  • Filename
    6367638
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1349470