Title :
Instrumentation: More bang for the buck: Test gear exploits complex integrated circuits to do more, faster
Abstract :
The use of large scale integrated circuits for measuring instruments especially the capacitance measurement is shown.
Keywords :
capacitance measurement; large scale integration; capacitance measurement; large scale integrated circuits; measuring instruments; Electrical resistance measurement; Instruments; Microprocessors; Radiation detectors; Safety; Semiconductor device measurement; Standards;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1977.6367638
