Title :
Bounds on Reliability of a Noncoherent System Using its Length & Width
Author :
Heidtmann, Klaus D.
Author_Institution :
Department of Mathematics and Computer Science; Postfach 940; D 5800 Fernuniversitÿt, Hagen, FED. REP. GERMANY.
Abstract :
A new kind of bounds on the reliability of s-noncoherent systems increases the variety of methods for probabilistic analysis of s-noncoherent systems. To compute the bounds, only a) the length and width of the system, and b) component reliabilities must be known. The weak and strong points of the bounds are illustrated by examples. The first example demonstrates the manifold applicability of s-noncoherent systems and compares the new bounds with those of Chu & Apostolakis.
Keywords :
Art; Circuits; Failure analysis; Reliability theory; Cuts; Lengths; Paths; Reliability bound; Widths; k-to-K-out-of-n system; s-Noncoherence;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1982.5221413