Title :
Nonparametric Accelerated Life Testing
Author :
Basu, A.P. ; Ebrahimi, Nader
Author_Institution :
Department of Statistics; University of Missouri; Columbia, Missouri 65211 USA.
Abstract :
This paper considers the problem of nonparametric accelerated life testing by extending the results of Shaked & Singpurwalla in two directions. First we solve the case of censored data. Next we extend the methods to the case of competing risks. A s-consistent estimate of the failure distribution at use-stress is given for both cases.
Keywords :
Acceleration; Costs; Life estimation; Life testing; Lifetime estimation; Neural networks; Reliability theory; Statistical analysis; Stress; System testing; Accelerated life tests; Censored data; Competing risks; Nonparametric methods; Series system; s-Consistent estimator;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1982.5221417
