Title :
Energy storage capacitors: aging, and diagnostic approaches for life validation
Author :
Sarjeant, W.J. ; MacDougall, F.W. ; Larson, D.W. ; Kohlberg, I.
Author_Institution :
State Univ. of New York, Buffalo, NY, USA
fDate :
1/1/1997 12:00:00 AM
Abstract :
Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance. In addition, voltage scaling issues that may drive bank fault-tolerance performance are described
Keywords :
ageing; capacitor storage; life testing; pulsed power technology; reliability; aging; capacitor reliability; component performance; diagnostic approaches; dimensional analysis; energy storage capacitors; fault tolerance; high energy pulse applications; life validation; manufacturing techniques; voltage scaling issues; Aging; Capacitors; Energy storage; Fault tolerance; Geometry; Insulation; Manufacturing; Materials reliability; Performance analysis; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
