• DocumentCode
    1349717
  • Title

    Vertical test integration

  • Author

    Jackson, Phil

  • Author_Institution
    Adv. Testing Technol. Inc., Hauppauge, NY, USA
  • Volume
    15
  • Issue
    6
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    43
  • Abstract
    Today, most every weapon system is electronics intensive. Digital computers are at the core of military aircraft, ship, and vehicle weapons systems. Indeed, each weapon system´s performance is largely determined by its digital computers and other electronics. This electronics dependency is necessary in order to provide the speed, functional compliance, and accuracy to achieve the required weapon system performance. Historically, test systems required for the various maintenance levels and also at the manufacturing site have each been uniquely developed, employed, and sustained for only one area of weapon system electronics support. There are a number of reasons for this situation including different organizations responsible for the levels of support, different funding sources, timing limitations, and technical feasibility. In recent years, however, commercial-off-the-shelf (COTS) advances in measurement and stimulation hardware, personal computers, Windows operating systems, flexible test programming languages, and more, have made it technically feasible to develop a family of test systems that provide common weapon system electronics support at all levels. Some use the phrase Vertical Test Integration to describe this concept of factory/field/depot integration
  • Keywords
    automatic test equipment; automatic testing; economics; military systems; weapons; COTS; commercial-off-the-shelf technology; common calibration; common documentation; common spare parts; common test languages; common training; common weapon system electronics support; factory/field/depot integration; flexible test programming languages; open ATE architecture; savings; vertical test integration; weapon system; Aerospace electronics; Electronic equipment testing; Manufacturing; Marine vehicles; Military aircraft; Military computing; System performance; System testing; Timing; Weapons;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.847930
  • Filename
    847930