DocumentCode :
1349731
Title :
The transistor behavior in a circuit with a shorted load
Author :
Porst, Alfred ; Herberg, Helmut ; Miller, Gerhard ; Strack, Helmut
Author_Institution :
Siemens AG, Munchen, West Germany
Volume :
26
Issue :
4
fYear :
1990
Firstpage :
803
Lastpage :
808
Abstract :
If a transistor is working in a circuit with a shorted load, two different cases have to be distinguished. Case 1 is when a transistor is switched on in a circuit with a shorted load. This case was treated in the past. A second case that has to be considered is when a short occurs during the on state of the transistor. The results of one-dimensional simulations for case 2 show that collector-emitter voltage at the transistor depends strongly on the current density, with the maximum field occurring at the n-n+ junction of the collector. During the first critical time interval, the metallurgical p-n junction has no influence. The high current densities occurring during the short can produce electric fields higher than 105 V/cm. These current-induced high electric fields result in a current runaway causing, finally, a thermal destruction of the transistor, even at voltages much lower than the specified stationary values. The current rise has to be limited by a small inductance allowing the transistor to consume voltage without exceeding critical field values
Keywords :
bipolar transistor circuits; network analysis; collector-emitter voltage; current densities; current runaway; electric fields; metallurgical p-n junction; n-n+ junction; one-dimensional simulations; shorted load; thermal destruction; transistor behavior; Choppers; Circuit simulation; Current density; Inductance; Industry Applications Society; P-n junctions; Power transistors; Pulse measurements; Switching circuits; Voltage;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.56009
Filename :
56009
Link To Document :
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