Title :
On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed Performance
Author :
Bogorad, Alexander L. ; Likar, Justin J. ; Lombardi, Robert E. ; Stone, Stephen E. ; Herschitz, Roman
Author_Institution :
Lockheed Martin Space Syst., Newtown, PA, USA
Abstract :
SEU data for more than 250 equivalent on-orbit SRAM device years is compared with upset rate calculations using various environmental models and contributions of both direct ionization and nuclear interactions.
Keywords :
SRAM chips; error statistics; ionisation; radiation hardening (electronics); RHBD SRAM; SEU data; calculation techniques; direct ionization; nuclear interactions; on-orbit SRAM device; on-orbit error rates; space environmental models; upset rate calculations; CMOS integrated circuits; Protons; Radiation effects; SRAM chips; Single event upset; Space vehicles; Radiation effects; single event upset (SEU); space radiation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2167242
