DocumentCode :
1349791
Title :
Analysis of Hg1-xCdxSe alloys in electroreflectance
Author :
Shaohua Liang
Author_Institution :
Dept. of Electron. Sci., Jilin Univ., Changchun
Volume :
24
Issue :
4
fYear :
1988
fDate :
2/18/1988 12:00:00 AM
Firstpage :
198
Lastpage :
199
Abstract :
An electrolyte electroreflectance study on Hg1-xCdxSe alloy films is first reported. The critical point energies E0 and E1 are obtained for different CdSe composition samples and material homogeneities are also discussed
Keywords :
II-VI semiconductors; cadmium compounds; electroreflectance; mercury compounds; semiconductor thin films; Hg1-xCdxSe; composition samples; critical point energies; electrolyte; electroreflectance; material homogeneities;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
Filename :
5601
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1349791
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