Title :
Birth-Death and Bug Counting
Author_Institution :
Bell Telephone Laboratories, Merrimack Valley; Bell Laboratories; 1600 Osgood Street; North Andover, MA 01845 USA.
fDate :
4/1/1983 12:00:00 AM
Abstract :
Many software reliability time-domain bug-counting models are, as fault counters, special cases of the stochastic process known as the death process. Generalization to a nonhomogeneous birth-death process achieves three ends: stochastic fault introduction, the synthesis of a time-dependent failure rate with imperfect debugging and fault introduction, and the mathematical unification of much bug-counting theory. Often, the price for generalization is mathematical intractability. Yet useful and tractable reliability measures with strong intuitive appeal are derived. The paper opens with a brief general discussion of software reliability and a selective review of some bug-counting models. Thereafter, the fundamental concepts and equations of a birth-death process are presented and applied to software reliability modeling. Assumptions for this application are then dealt with at some length. Reliability measures-initial, present, and future - are developed. Finally. the practical application of the model in the reliability assessment of a software package is discussed.
Keywords :
Failure analysis; Hardware; Reliability engineering; Reliability theory; Software debugging; Software measurement; Software packages; Software reliability; Stochastic processes; Time domain analysis; Nonhomogeneous failure intensity; Software reliability; Stochastic fault introduction;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1983.5221472