DocumentCode :
1350040
Title :
Common-Mode Emissions Measurements and Simulation in Variable-Speed Drive Systems
Author :
Jettanasen, Chaiyan ; Costa, François ; Vollaire, Christian
Author_Institution :
Ampere Lab., Ecole Centrale de Lyon, Ecully, France
Volume :
24
Issue :
11
fYear :
2009
Firstpage :
2456
Lastpage :
2464
Abstract :
In order to efficiently reduce electromagnetic interference emissions, especially common-mode (CM)-conducted noise emissions, which are the most disturbing in any variable-speed drive systems, the understanding of behavior and the knowledge of propagation path of parasitic currents in the system are essential. In this paper, a simple CM disturbances modeling is proposed to predict or estimate the CM noise currents. The modeling principle is based on specific experimental characterizations and the modeling of the complete CM circuit considered as a chain of quadripolar matrices. Each part of the system is represented by a two-port network associated in cascade using matrix [T]. The comparison between calculations and experiments in a variable-speed drive system effectively confirms the validity of the proposed approach. Parametric studies carried out herein using this valid model will show the way in which CM currents could be reduced or eliminated in a considered existing system.
Keywords :
electromagnetic interference; variable speed drives; common-mode emissions measurements; common-mode-conducted noise emissions; electromagnetic interference emissions; quadripolar matrices; variable-speed drive systems; Circuit simulation; Computational modeling; Drives; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Pulse inverters; Pulse width modulation inverters; Semiconductor device noise; Voltage; Common-mode (CM) emissions; electromagnetic compatibility (EMC)/electromagnetic interference (EMI); pulsewidth modulation (PWM) inverter; two-port network modeling; variable-speed drive;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2009.2031493
Filename :
5346844
Link To Document :
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