DocumentCode
1350040
Title
Common-Mode Emissions Measurements and Simulation in Variable-Speed Drive Systems
Author
Jettanasen, Chaiyan ; Costa, François ; Vollaire, Christian
Author_Institution
Ampere Lab., Ecole Centrale de Lyon, Ecully, France
Volume
24
Issue
11
fYear
2009
Firstpage
2456
Lastpage
2464
Abstract
In order to efficiently reduce electromagnetic interference emissions, especially common-mode (CM)-conducted noise emissions, which are the most disturbing in any variable-speed drive systems, the understanding of behavior and the knowledge of propagation path of parasitic currents in the system are essential. In this paper, a simple CM disturbances modeling is proposed to predict or estimate the CM noise currents. The modeling principle is based on specific experimental characterizations and the modeling of the complete CM circuit considered as a chain of quadripolar matrices. Each part of the system is represented by a two-port network associated in cascade using matrix [T]. The comparison between calculations and experiments in a variable-speed drive system effectively confirms the validity of the proposed approach. Parametric studies carried out herein using this valid model will show the way in which CM currents could be reduced or eliminated in a considered existing system.
Keywords
electromagnetic interference; variable speed drives; common-mode emissions measurements; common-mode-conducted noise emissions; electromagnetic interference emissions; quadripolar matrices; variable-speed drive systems; Circuit simulation; Computational modeling; Drives; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Pulse inverters; Pulse width modulation inverters; Semiconductor device noise; Voltage; Common-mode (CM) emissions; electromagnetic compatibility (EMC)/electromagnetic interference (EMI); pulsewidth modulation (PWM) inverter; two-port network modeling; variable-speed drive;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2009.2031493
Filename
5346844
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