• DocumentCode
    1350095
  • Title

    Automatically Controlled 2-Vessel Pressure-Cooker Test-Equipment

  • Author

    Ogawa, K. ; Suzuki, J. ; Sano, K.

  • Author_Institution
    Device Rel. Sec.; Int. Electronics Dev. Div.; Musashino Electrical Communication Laboratory; Nippon Telegraph & Telephone Public Corp.; 3-9-11, Midoricho, Musashino-shi; Tokyo 180 JAPAN.
  • Issue
    2
  • fYear
    1983
  • fDate
    6/1/1983 12:00:00 AM
  • Firstpage
    164
  • Lastpage
    167
  • Abstract
    A highly accelerated humidity test for plastic encapsulated IC reliability short-term evaluation has been studied. 2-Vessel pressure cooker test (PCT) equipment capable of controlling relative humidity and temperature independently, and of keeping specimens free from water droplet condensation, has been designed. This equipment consists of a test chamber and a vapor chamber. Humidity conditions are set by controlling the temperature difference between the test chamber and the vapor chamber. Humidity levels are controlled with the direct pressure adjustment. The whole test chamber is heated in an oven, thereby obtaining temperature stability and uniformity. Using this equipment, humidity tests were carried out on plastic molded ICs. As a result, good test reproducibility and excellent correlation in test results between PCT and conventional humidity test such as 85°C/85%RH, were obtained. As a consequence, it was found possible, in a short time, to evaluate plastic molded IC reliability quantitatively in humidity ambients using this 2-vessel PCT equipment. This equipment can be used for quality assurance testing of plastic-encapsulated ICs in a short time.
  • Keywords
    Automatic control; Automatic testing; Humidity control; Integrated circuit testing; Life estimation; Ovens; Plastics; Pressure control; Stability; Temperature control; Accelerated testing; Aluminum corrosion; Humidity; Plastic molded IC; Pressure cooker test;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1983.5221516
  • Filename
    5221516