Title :
Automatically Controlled 2-Vessel Pressure-Cooker Test-Equipment
Author :
Ogawa, K. ; Suzuki, J. ; Sano, K.
Author_Institution :
Device Rel. Sec.; Int. Electronics Dev. Div.; Musashino Electrical Communication Laboratory; Nippon Telegraph & Telephone Public Corp.; 3-9-11, Midoricho, Musashino-shi; Tokyo 180 JAPAN.
fDate :
6/1/1983 12:00:00 AM
Abstract :
A highly accelerated humidity test for plastic encapsulated IC reliability short-term evaluation has been studied. 2-Vessel pressure cooker test (PCT) equipment capable of controlling relative humidity and temperature independently, and of keeping specimens free from water droplet condensation, has been designed. This equipment consists of a test chamber and a vapor chamber. Humidity conditions are set by controlling the temperature difference between the test chamber and the vapor chamber. Humidity levels are controlled with the direct pressure adjustment. The whole test chamber is heated in an oven, thereby obtaining temperature stability and uniformity. Using this equipment, humidity tests were carried out on plastic molded ICs. As a result, good test reproducibility and excellent correlation in test results between PCT and conventional humidity test such as 85°C/85%RH, were obtained. As a consequence, it was found possible, in a short time, to evaluate plastic molded IC reliability quantitatively in humidity ambients using this 2-vessel PCT equipment. This equipment can be used for quality assurance testing of plastic-encapsulated ICs in a short time.
Keywords :
Automatic control; Automatic testing; Humidity control; Integrated circuit testing; Life estimation; Ovens; Plastics; Pressure control; Stability; Temperature control; Accelerated testing; Aluminum corrosion; Humidity; Plastic molded IC; Pressure cooker test;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1983.5221516