DocumentCode
1350095
Title
Automatically Controlled 2-Vessel Pressure-Cooker Test-Equipment
Author
Ogawa, K. ; Suzuki, J. ; Sano, K.
Author_Institution
Device Rel. Sec.; Int. Electronics Dev. Div.; Musashino Electrical Communication Laboratory; Nippon Telegraph & Telephone Public Corp.; 3-9-11, Midoricho, Musashino-shi; Tokyo 180 JAPAN.
Issue
2
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
164
Lastpage
167
Abstract
A highly accelerated humidity test for plastic encapsulated IC reliability short-term evaluation has been studied. 2-Vessel pressure cooker test (PCT) equipment capable of controlling relative humidity and temperature independently, and of keeping specimens free from water droplet condensation, has been designed. This equipment consists of a test chamber and a vapor chamber. Humidity conditions are set by controlling the temperature difference between the test chamber and the vapor chamber. Humidity levels are controlled with the direct pressure adjustment. The whole test chamber is heated in an oven, thereby obtaining temperature stability and uniformity. Using this equipment, humidity tests were carried out on plastic molded ICs. As a result, good test reproducibility and excellent correlation in test results between PCT and conventional humidity test such as 85°C/85%RH, were obtained. As a consequence, it was found possible, in a short time, to evaluate plastic molded IC reliability quantitatively in humidity ambients using this 2-vessel PCT equipment. This equipment can be used for quality assurance testing of plastic-encapsulated ICs in a short time.
Keywords
Automatic control; Automatic testing; Humidity control; Integrated circuit testing; Life estimation; Ovens; Plastics; Pressure control; Stability; Temperature control; Accelerated testing; Aluminum corrosion; Humidity; Plastic molded IC; Pressure cooker test;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1983.5221516
Filename
5221516
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