Title :
Voltage-Testing of Thin-film Capacitors
Author_Institution :
Institute of Electron Technology; Technical University; ul. Z. Janiszewskiego 11/17; 50-372 Wroclaw, POLAND.
fDate :
6/1/1983 12:00:00 AM
Abstract :
The influence of proof-test voltage and testing time on the working-life distribution of thin film capacitors is presented. The proof-test not only eliminates capacitors with low breakdown voltage, it decreases the working life of the remaining components. A short proof-test is proposed to avoid degrading the remaining components. The test method for estimating the distribution parameters is presented.
Keywords :
Breakdown voltage; Capacitors; Cost function; Degradation; Dielectric thin films; Life testing; Parameter estimation; Probability distribution; Production; Transistors; Dielectric; Testing; Thin-film capacitors;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1983.5221518
