Title :
Roundtable: Reliability of Embedded and Cyber-Physical Systems
Author :
Barnum, Sean ; Sastry, Shankar ; Stankovic, John A.
Abstract :
As part of this special issue, the guest editors put together a roundtable discussion to delve into topics the chosen articles didn´t touch upon. Sean Barnum (MITRE); Shankar Sastry (UC Berkeley); and John A. Stankovic (University of Virginia) spoke on many topics.
Keywords :
computer network security; embedded systems; reliability; cyber physical system; embedded system reliability; roundtable discussion; Embedded system; Interviews; Medical services; Reliability; Smart grids; cyberphysical systems; embedded systems; healthcare; reliability; smart grid;
Journal_Title :
Security & Privacy, IEEE
DOI :
10.1109/MSP.2010.162
