DocumentCode :
1350245
Title :
Statistical Approach to Failure Modeling in Accelerated Life Tests
Author :
luculano, Gaetano ; Zanini, Antonio
Author_Institution :
Dept. of Electronics Engineering; University of Florence; via S. Marta 3; 50139 Firenze, ITALY.
Issue :
2
fYear :
1983
fDate :
6/1/1983 12:00:00 AM
Firstpage :
220
Lastpage :
220
Keywords :
Electronic equipment testing; Knowledge engineering; Life estimation; Life testing; Reliability engineering; Stress; Accelerated life test; Eyring model; Statistical moments; Time to failure; s-Normal joint distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1983.5221540
Filename :
5221540
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1350245
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