DocumentCode :
1350503
Title :
Flash-Aware RAID Techniques for Dependable and High-Performance Flash Memory SSD
Author :
Soojun Im ; Dongkun Shin
Author_Institution :
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
Volume :
60
Issue :
1
fYear :
2011
Firstpage :
80
Lastpage :
92
Abstract :
Solid-state disks (SSDs), which are composed of multiple NAND flash chips, are replacing hard disk drives (HDDs) in the mass storage market. The performances of SSDs are increasing due to the exploitation of parallel I/O architectures. However, reliability remains as a critical issue when designing a large-scale flash storage. For both high performance and reliability, Redundant Arrays of Inexpensive Disks (RAID) storage architecture is essential to flash memory SSD. However, the parity handling overhead for reliable storage is significant. We propose a novel RAID technique for flash memory SSD for reducing the parity updating cost. To reduce the number of write operations for the parity updates, the proposed scheme delays the parity update which must accompany each data write in the original RAID technique. In addition, by exploiting the characteristics of flash memory, the proposed scheme uses the partial parity technique to reduce the number of read operations required to calculate a parity. We evaluated the performance improvements using a RAID-5 SSD simulator. The proposed techniques improved the performance of the RAID-5 SSD by 47 percent and 38 percent on average in comparison to the original RAID-5 technique and the previous delayed parity updating technique, respectively.
Keywords :
RAID; disc drives; flash memories; hard discs; NAND flash chips; RAID storage architecture; RAID-5 SSD simulator; flash memory SSD; flash-aware RAID techniques; hard disk drives; mass storage market; parallel I/O architectures; redundant arrays of inexpensive disks; solid-state disks; Arrays; Error correction codes; Flash memory; Random access memory; Redundant arrays of inexpensive disks (RAID); dependability.; flash memory; reliability; solid-state disk (SSD);
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2010.197
Filename :
5601690
Link To Document :
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