• DocumentCode
    1350571
  • Title

    Adaptive Cache Design to Enable Reliable Low-Voltage Operation

  • Author

    Alameldeen, Alaa R. ; Chishti, Zeshan ; Wilkerson, Chris ; Wu, Wei ; Lu, Shih-Lien

  • Author_Institution
    Intel Labs., Hillsboro, OR, USA
  • Volume
    60
  • Issue
    1
  • fYear
    2011
  • Firstpage
    50
  • Lastpage
    63
  • Abstract
    The performance/energy trade-off is widely acknowledged as a primary design consideration for modern processors. A less discussed, though equally important, trade-off is the reliability/energy trade-off. Many design features that increase reliability (e.g., redundancy, error detection, and correction) have the side effect of consuming more energy. Many energy-saving features (e.g., voltage scaling) have the side effect of making systems less reliable. In this paper, we propose an adaptive cache design that enables the operating system to optimize for performance or energy efficiency without sacrificing reliability. Our proposed mechanism enables a cache with a wide operating range, where the cache can use a variable part of its data array to store error-correcting codes. A reliable, energy-efficient cache can use up to half of its data array to store error-correcting codes so that it can reliably operate at a low voltage to reduce energy. A reliable high-performance cache uses its whole data array, but operates at a higher voltage to improve reliability while sacrificing energy. We propose a hardware mechanism that allows the operating system to choose different points within that operating range based on the desired levels of performance, energy, and reliability.
  • Keywords
    cache storage; error correction codes; fault tolerant computing; low-power electronics; microprocessor chips; operating systems (computers); reliability; adaptive cache design; data array; energy saving feature; error correcting code; fault tolerance; low voltage operation; reliability energy trade off; Error analysis; Error correction codes; Low voltage; Program processors; Random access memory; Redundancy; Design; dependable design.; fault tolerance; reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2010.207
  • Filename
    5601699