Title :
Millimeter-wave backscatter characteristics of multilayered snow surfaces
Author :
Narayanan, Ram M. ; McIntosh, Robert E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
fDate :
5/1/1990 12:00:00 AM
Abstract :
Backscatter measurements are presented of various snow packs made during the 1987-8 winter season with a unique 215-GHz radar system. Measurements were made for VV, HH, VH, and HV polarizations. Concurrent ground truth measurements of snow surface roughness, moisture content, density, hardness, particle size, and grain type were also made. These measured ground truth parameters are used as inputs to a simple model based on geometrical optics and Mie scattering theory for comparison with the observed backscatter characteristics. It is found that the model can predict general levels and overall trends of the backscatter for a variety of snow conditions
Keywords :
backscatter; electromagnetic wave scattering; radar applications; snow; 215 GHz; EHF; HH polarisation; HV polarizations; MM wave; Mie scattering theory; VH polarisation; VV polarisation; backscatter characteristics; density; geometrical optics; grain type; ground truth parameters; hardness; moisture content; multilayered snow surfaces; particle size; remote sensing; snow surface roughness; Backscatter; Density measurement; Millimeter wave measurements; Millimeter wave radar; Moisture measurement; Optical polarization; Particle measurements; Radar measurements; Size measurement; Snow;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
