• DocumentCode
    1350759
  • Title

    Reliability Investment and Life-Cycle Cost

  • Author

    Seger, James K.

  • Author_Institution
    Dept. 66-32; Bldg. 170, Lockheed-California Company; Burbank, California 91520 USA.
  • Issue
    3
  • fYear
    1983
  • Firstpage
    259
  • Lastpage
    263
  • Abstract
    The reliability of avionic equipment profoundly influences life-cycle cost; the level of reliability attained largely depends upon the investment in reliability programs during development. As more investment is made in reliability improvement, some cost elements increase and others decrease. These opposing cost trends yield a unique minimum life-cycle cost (LCC). In order to find the level of investment in a reliability improvement program that minimizes LCC, the Reliability Investment Optimization (RIO) model has been developed. It identifies, for a particular avionic system, the level of reliability investment that minimizes the LCC of the equipment. This model employs a reliability-growth relationship based on the Duane model. The RIO model uses this reliability growth pattern to compute LCC as a function of MTBF (mean time between failures) where LCC comprises: 1) research, development, test and evaluation (RDT&E), 2) procurement, and, 3) operations and support (O&S). The RIO model uses summary level data that are appropriate for the timeframe of its most advantageous use, i.e., prior to detail design of the system. The degree of accuracy for the input parameters need not be high because results are not very sensitive to data accuracy. The model´s results thus are quite stable. The RIO model was designed with avionic systems in mind. However, the model applies to a wider range of systems. Certain assumptions should be particularly scrutinized in extending usage beyond avionics, e.g., Poisson demand assumption versus a wearout failure pattern (failure rate increases over time), scheduled maintenance, and LCC element breakdown.
  • Keywords
    Aerospace electronics; Cost function; Data engineering; Engineering management; Investments; Life testing; Manufacturing processes; Production; Quality management; System testing; Life-cycle cost; Reliability growth; Reliability investment; Reliability test program;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1983.5221643
  • Filename
    5221643