Title :
Multiple Kernel Learning for Dimensionality Reduction
Author :
Lin, Yen Yu ; Liu, Tyng Luh ; Fuh, Chiou Shann
Author_Institution :
Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
fDate :
6/1/2011 12:00:00 AM
Abstract :
In solving complex visual learning tasks, adopting multiple descriptors to more precisely characterize the data has been a feasible way for improving performance. The resulting data representations are typically high-dimensional and assume diverse forms. Hence, finding a way of transforming them into a unified space of lower dimension generally facilitates the underlying tasks such as object recognition or clustering. To this end, the proposed approach (termed MKL-DR) generalizes the framework of multiple kernel learning for dimensionality reduction, and distinguishes itself with the following three main contributions: First, our method provides the convenience of using diverse image descriptors to describe useful characteristics of various aspects about the underlying data. Second, it extends a broad set of existing dimensionality reduction techniques to consider multiple kernel learning, and consequently improves their effectiveness. Third, by focusing on the techniques pertaining to dimensionality reduction, the formulation introduces a new class of applications with the multiple kernel learning framework to address not only the supervised learning problems but also the unsupervised and semi-supervised ones.
Keywords :
learning (artificial intelligence); object recognition; pattern clustering; dimensionality reduction; multiple kernel learning; object clustering; object recognition; supervised learning problems; Eigenvalues and eigenfunctions; Kernel; Laplace equations; Machine learning; Optimization; Principal component analysis; Training; Dimensionality reduction; face recognition.; image clustering; multiple kernel learning; object categorization; Algorithms; Artificial Intelligence; Cluster Analysis; Face; Humans; Image Processing, Computer-Assisted; Pattern Recognition, Automated; Software;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2010.183